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Sensor Analytics helps semiconductor manufacturers increase yield and reduce costs by optimizing their defect inspection operations.
Sensor Analytics is proud to have received NSF SBIR Phase I and II funding to develop a new software to help semiconductor and high-tech factories get the most out of their metrology resources.
Sensor Analytics is currently working with select semiconductor industry clients to implement this new enterprise software called Inspection Manager, soon to be followed by Metrology Manager.
For the time being, marketing of our planning services and IP1.0 software has been suspended, but interested parties are free to contact us.
Questions we can address:
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