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11 Jul 2006 1 Jan 2006 13 Sep 2005 9 Aug 2005 Dr.Gudmundsson invited to speak at the SEMICON West 2006 TechXPOT on Manufacturing Productivity & Effectiveness As a part of the AEC/APC symposium preview, Dr. Gudmundsson will speak about “Advanced Inspection Planning Models to Decrease Defect Inspection Costs and Increase Yield”. The presentation introduces recent advances in analytic modeling of defect inspection requirements. These advances provide fabs with one-of-a-kind capability to analyze and plan defect inspection requirements using process, defect, and economic data. The TechXPOTS at Semicon West 2006 are four technology focused “shows-within-the-show” featuring exhibits, live technical presentations, and more. The Manufacturing Productivity and Effectiveness TechXPOT (Esplanade Hall) features companies and technologies focused on improving manufacturing productivity within the fab and through better device design. The AEC/APC (Advanced Equipment Control / Advanced Process Control) symposium is organized and hosted by ISMI and Sematech. Industry leaders identify defect detection as the top yield management challenge The 2005 International Technology Roadmap for Semiconductors (ITRS) identified the No. 1 challenge with yield enhancement as the ability to detect defects of sizes that scale as quickly or faster than the device features scale.[Full report] Commentary: Sensor Analytics was founded in response to the trends and needs expressed here. As the economic impact of defect detection continues to increase we can help fabs make the optimal choices in inspection capacity and sampling plans. Sensor Analytics founder presents two papers at ISSM 2005 In a talk at the Manufacturing Strategy and Management session, Dr. Gudmundsson presented his paper: "Integrated process and inspection/metrology capacity planning" [get paper]. The paper presents new research results that demonstrate fundamental links between process tool and inspection & metrology tool capacity planning. In the interactive poster session, Dr. Gudmundsson presented his paper: "Improving the deployment of inspection tools; tutorial on inspection capacity and sample planning" [get paper]. The papers can be dowloaded by clicking on the paper names. Papers copyrighted by Dr. Dadi Gudmundsson and IEEE ISSM. Contact Sensor Analytics about potential redisdribution of these papers.      Fab spending on process control reaches a new high Pacific Crest Tech Forum, Vail Colorado. In a presentation to investors, KLA-Tencor Inc. shows that semiconductor fab spending on process control has reached 15% of total capital expenditure (capex). In the late 1990s it was around 5%, in 2000 it was 10%. A significant portion of this spending is on advanced sensors, i.e. inspection and metrology tools capable of detecting sub 100nm defects and features. Commentary: fab capex plans are based on careful analysis of the requirements for profitable production. Sensor Analytics provides the services and software for capex planning that takes the costs and benefits of process control explicitly into account.

Copyright 2006, Sensor Analytics.