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Services overview A unifying theme in our services is the calculation of process control benefits, not just the costs. Only this way can the optimal solution be found. Sensor Analytics offers the below standardized services to optimize the use and choice of inspection tools in semiconductor manufacturing:             Inspection Planning Features include: Defect inspection capacity planning Lot, wafer, and review sampling plans. Economic comparison of inspection tools Integrated Capacity  Planning Features include: Joint process and inspection tool capacity planning Yield impact/economic evaluation of material handling systems Projects that do not fit into the above categories are addressed as custom projects. Custom projects Sample projects: Reticle inspection and metrology planning Economic evaluation of methods/materials/equipment that affect yield, throughput, cycle-time and/or efficiency General (non-semiconductor specific) process control decision analysis Simulation modeling of process control & general fab operations

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