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Sensor Analytics helps semiconductor manufacturers increase yield and reduce costs by optimizing their defect inspection operations.

We use process and economic data to calculate the inspection capacity & sampling plans that provide the greatest financial return. This is accomplished with state of the art stochastic algorithms in our proprierary Inspection Planner software. Analogous services are offered for reticle inspection and general metrology operations.

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Sensor Analytics has unparalleled expertise in the field of semiconductor defect inspection planning. Our consultants have researched, developed, and deployed the cutting edge planning tools that exist today. Our mission is to help our clients identify cost effective ways to control their processes. 

Sensor Analytics is reaching beyond the semiconductor industry. Our expertise and software can be applied wherever process control costs significantly affect profitability.

11 Jul 2006. Dr. Gudmundsson invited to speak at a SEMICON West 2006 TechXPOT.

1 Jan 2006. ITRS roadmap identifies defect detection as the top yield management challenge.

13 Sep 2005. Sensor Analytics founder presents two papers at ISSM 2005.

9 Aug 2005. Fab spending on process control reaches a new high.

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Copyright 2006, Sensor Analytics.